Reliability of Laser Diodes for Space Flight Applications

Reliability of Laser Diodes for Space Flight Applications
This page will contain information related to the reliability of laser diodes for usage in a space flight environment. The documents that appear here will be solely on this subject for usage by space flight hardware engineers design, packaging and parts engineers.
Packaging Issues
	Gold-Indium Intermetallic Compounds: Properties & Growth Rates, Authored by Jane Jellison, Materials Control & Applications Branch, November 1979. Indium Solder Encapsulating Gold Bonding Wire Leads to Fragile Gold-Indium Compounds and an Unreliable Condition that Results in Wire Interconnection Rupture, Goddard Space Flight Center, NASA Parts Advisory NA-GSFC-2004-01, September 2003. Application Notes from the Indium Corporation, www.indium.com The NASA Electronic Parts and Packaging Program (NEPP) Wire Bond Website Whiskers of Tin-Lead (Sn-Pb) on Reflowed Die Attach Solder Used in the Manufacture of a Laser Diode Array, Dr. Henning Leidecker, Dec. 2003.
Testing Methods & Data Reports and Publications
	Characterization of 808 nm Quasi-contant Wave Laser Diode Arrays, Mark Stephen, Aleksey Vasilyev, 2003 NASA Earth Science Technology Conference for ESTO, NASA GSFC. Extreme Temperature Cycling of SDL G-package Laser Dummy Arrays, Boris Schroder, SLTC Technical Memorandum-GLAS-14, July 14, 1999. Multi-Billion Shot, High Fluence Exposure of Cr4+:YAG Passive Q-Switch, M.A.Stephen, J.L. Dallas, R.S. Afzal, SPIE Proceedings from 29th Annual Boulder Damage Symposium; Laser-Induced Damage in Optical Materials: Vol. 3244, October 6-8, 1997. Performance Tests of Quasi-CW Diode Pump Arrays Conducted or Sponsored by NASA Goddard Space Flight Center, M. Krainak, R. Afzal, M. Stephen, G. Browder, J. Haden, N. Carlson, 1997 Digest of LEOS Summer Topical Meetings: Advanced Semiconductor Lasers and Applications. Demonstration and Characterization of a Multi-Billion Shot, 2.5 mJ, 4-ns, Q-switched Nd:YAG Laser, J.L. Dallas, R.S. Afzal, M.A. Stephen, Applied Optics Vol. 35 No. 9, March 20, 1996. Accelerated GLAS Exposure Station, J.L. Dallas, R.S. Afzal, M.D.Selker, M.A.Stephen, SPIE Proceedings from the 26th Annual Boulder Damage Symposium; Laser-Induced Damage in Optical Materials, 1994, Vol. 2428, October 26-28.
Reliability Guidelines
	High Power Laser Diode Array Qualification and Guidelines for Space Flight Environments 2006 NASA Parts and Packaging Program, 2006 Capabilities and Reliability of LEDs and Laser Diodes What's New in Electronics, Vol. 20 N. 6, November 2000, Melanie Ott (Also published in 1997 by NASA Electronic Parts and Packaging Program)
Destructive Physical Analysis and Failure Reliability Reports
	Laser Diode Destructive Physical Analysis Report for CALIPSO, Goddard Space Flight Center Report Number Q30275EV, Frederick Felt, QSS, September 2003. Updated Laser Diode Bar Lifetest Failure Data Analysis, NASA-Goddard Space Flight Center Code 302, W. Thomas, Systems Safety and Reliability Office Technical Memorandum, . Laser Damage Threshold Study, Spica Technologies, Technical Report #N032697 to NASA Goddard Space Flight Center, March 26, 1997. Appendix 1, Appendix 2, Appendix 3. Quasi-CW Laser Diode Bar Life Tests, M.A. Stephen, M.A. Krainak, J.L. Dallas, SPIE Proceedings from 29th Annual Boulder Damage Symposium; Laser-Induced Damage in Optical Materials: Vol. 3244, October 6-8, 1997. Independent GLAS Anomaly Review Board Executive Summary, (IGARB report) November 4, 2003.